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DF-750 NanoTrace Tunable Diode Laser Trace/Ultra-Trace Moisture Analyzer
Brand: SERVOMEXDesigned specifically to make trace and ultra-trace measurements in a range of ultra high purity gases, the DF-750 is the leading choice in moisture analysis for the semiconductor industry.
Optimized for use in 300 mm semiconductor fabs, the DF-750 measures moisture as a contaminant in electronics grade nitrogen, hydrogen, helium, argon and oxygen.
With Servomex’s industry-leading TDL sensing technology delivering an industry-leading 100 ppt Lower Detection Limit, the DF 750 delivers a stable, highly accurate measurement that meets the precise monitoring needs of semiconductor production.
This analyzer also offers attractive affordability over product life. The DF-750’s robust sensor construction has low lifetime maintenance requirements and delivers zero-drift stability that greatly extends calibration intervals. This low cost of ownership combined with exceptional measurement performance, the DF-750 is the first-choice analytical solution for UHP gas quality checks.
Specifications
Brand
Accuracy
- ± 3 % of Reading / ± 0.2 ppb, whichever is greater
Approvals & Certifications
- EU EMC Directive
- EU Low Voltage Directive (LVD)
- IEC 61010-1
Environmental Protection
- IP10
- NEMA 1
Operating Temperature
- 10° to 40° C (50° to 104° F)
Pressure Range
- Sample Pressure - psig: 30 to 150 (bar: 2.07 to 10.34, kPa: 207 to 1,034) (3.08 to 11.3 barA)
Process Connection - Other
- 1/4” Compression Fitting
Range
- 0 to 20 ppm to 0 to 2 ppb Min
